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Smiths Connectors offers Wafer Level Chip Scale Package (WLCSP) Probe Heads utilizing spring probe technology which provide high parallelism in test, superior signal integrity and high speed / RF testing capability.
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Monet Probe Heads

  • Ideal for pitches > 200 µm
  • Superior signal integrity
  • Short signal path < 3 mm
  • Stable C-res over 750K cycles
  • High degree of parallelism
  • Patented technology
MarketID in (10) False /us/products/product-catalog/volta-series-probe-heads

Volta Series Probe Heads

  • Suited for pitches 300 to 500 µm
  • High degree of parallelism
  • High density
  • Stable c-res over 750K cycles
  • Excellent co-planarity